Reliability Assessment Solutions Inc. (RAS) is a leading provider of advanced solutions for reliability testing of electronic assemblies and components.

The HATS²™ (Highly Accelerated Thermal Shock) test system was specifically developed to simulate convective reflow assembly and to evaluate the reliability and robustness of printed circuit boards, substrate-via structures, and PTHs. This state-of-the-art technology enables precise and efficient thermal shock testing and provides meaningful insights into the resilience of electronic components.

The system’s outstanding features include real-time monitoring of electrical resistance, rapid temperature changes between −65 °C and +265 °C, and the ability to perform up to 1,000 thermal shock cycles per week. This allows for the reliable detection of potential failure mechanisms such as barrel cracking and connection failures.

With HATS²™, manufacturers can ensure that their electronics function reliably not only under laboratory conditions but also under real-world stresses. This robust and precise system is therefore an indispensable tool for reliability assessment in demanding industries such as aerospace, defense, medical technology, and electronics manufacturing.